【英文标准名称】:StandardGuidefortheMeasurementofSingleEventPhenomena(SEP)InducedbyHeavyIonIrradiationofSemiconductorDevices
【原文标准名称】:半导体器件重离子照射感应产生的单件信号现象的测量标准指南
【标准号】:ASTMF1192-2000(2006)
【标准状态】:现行
【国别】:
【发布日期】:2000
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:SEB;SEE;SEFI;SEGR;SEL;SEP;SEPcrosssection;SEU;singleevent;singleeventeffect;singleeventphenomena;singleeventupset;spaceenvironment
【摘要】:Manymodernintegratedcircuits,powertransistors,andotherdevicesexperienceSEPwhenexposedtocosmicraysininterplanetaryspace,insatelliteorbitsorduringashortpassagethroughtrappedradiationbelts.ItisessentialtobeabletopredicttheSEPrateforaspecificenvironmentinordertoestablishpropertechniquestocountertheeffectsofsuchupsetsinproposedsystems.AsthetechnologymovestowardhigherdensityICs,theproblemislikelytobecomeevenmoreacute.ThisguideisintendedtoassistexperimentersinperforminggroundteststoyielddataenablingSEPpredictionstobemade.1.1Thisguidedefinestherequirementsandproceduresfortestingintegratedcircuitsandotherdevicesfortheeffectsofsingleeventphenomena(SEP)inducedbyirradiationwithheavyionshavinganatomicnumberZ2.Thisdescriptionspecificallyexcludestheeffectsofneutrons,protons,andotherlighterparticlesthatmayinduceSEPviaanothermechanism.SEPincludesanymanifestationofupsetinducedbyasingleionstrike,includingsofterrors(oneormoresimultaneousreversiblebitflips),harderrors(irreversiblebitflips),latchup(permanenthighconductingstate),transientsinducedincombinatorialdeviceswhichmayintroduceasofterrorinnearbycircuits,powerfieldeffecttransistor(FET)burn-outandgaterupture.Thistestmaybeconsideredtobedestructivebecauseitofteninvolvestheremovalofdevicelidspriortoirradiation.Bitflipsareusuallyassociatedwithdigitaldevicesandlatchupisusuallyconfinedtobulkcomplementarymetaloxidesemiconductor,(CMOS)devices,butheavyioninducedSEPisalsoobservedincombinatoriallogicprogrammablereadonlymemory,(PROMs),andcertainlineardevicesthatmayrespondtoaheavyioninducedchargetransient.PowertransitorsmaybetestedbytheprocedurecalledoutinMethod1080ofMILSTD750.1.2TheproceduresdescribedherecanbeusedtosimulateandpredictSEParisingfromthenaturalspaceenvironment,includinggalacticcosmicrays,planetarytrappedionsandsolarflares.Thetechniquesdonot,however,simulateheavyionbeameffectsproposedformilitaryprograms.TheendproductofthetestisaplotoftheSEPcrosssection(thenumberofupsetsperunitfluence)asafunctionofionLET(linearenergytransfer,orionizationdepositedalongtheion''spaththroughthesemiconductor).Thisdatacanbecombinedwiththesystem''sheavyionenvironmenttoestimateasystemupsetrate.1.3AlthoughprotonscancauseSEP,theyarenotincludedinthisguide.AseparateguideaddressingprotoninducedSEPisbeingconsidered.1.4ThevaluesstatedinInternationalSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisguide.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:11P.;A4
【正文语种】:


【英文标准名称】:Safetyofmachinery-Pressuresensitiveprotectivedevices-Part2:Generalprinciplesforthedesignandtestingofpressuresensitiveedgesandpressuresensitivebars;GermanversionEN1760-2:2001
【原文标准名称】:机械安全性.压敏保护装置.第2部分:压敏边缘和压敏条试验和设计一般规则
【标准号】:DINEN1760-2-2001
【标准状态】:作废
【国别】:德国
【发布日期】:2001-07
【实施或试行日期】:
【发布单位】:德国标准化学会(DE-DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:检验;机器;使用;设备安全;机器的安全;特性;机械工程;安全工程;操作;安全要求;设计;保护设备;规范(验收);定义;定义;保护装置;事故预防;指导原则;危险防护;压敏条;安全;安全;操作安全;触点;木楔;人体保护;可靠性试验;开关操作;压力;开关设备;安全试验;竿材;开关绝缘棒;试验;电气工程
【英文主题词】:Access;Accidentprevention;Activities;Applications;Cleats(woodwork);Climate;Contact;Corners;Definitions;Design;Electricalengineering;Electrostatics;Enclosures;Energy;Energysupplysystems(buildings);Equipmentsafety;Guidingprinciple;Impact;Inspection;Machines;Marking;Mechanicalengineering;Mechanicalproperties;Operation;Operationalsafety;Poles;Pressure;Pressuresensitivebars;Properties;Protectionagainstdanger;Protectiondevices;Protectionofpersons;Protectivedevices;Reliabilitytesting;Safety;Safetyengineering;Safetyofmachinery;Safetyrequirements;Safetytests;Signals;Specification(approval);Surfaces;Switchrods;Switchgears;Switching;Testing;Vibration
【摘要】:
【中国标准分类号】:L22
【国际标准分类号】:13_110
【页数】:51P;A4
【正文语种】:德语